Microchip Technology DM164134 数据表

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页码 402
© 2006 Microchip Technology Inc.
DS41159E-page 339
PIC18FXX8
TABLE 27-2:
DC CHARACTERISTICS: EEPROM AND ENHANCED FLASH 
DC Characteristics
Standard Operating Conditions
Param
No.
Sym
Characteristic
Min
Typ†
Max
Units
Conditions
Internal Program Memory
Programming Specifications
D110
V
PP
Voltage on MCLR/V
PP
 pin
9.00
13.25
V
D113
I
DDP
Supply Current during 
Programming
10
mA
Data EEPROM Memory
D120
E
D
Cell Endurance
100K
1M
E/W
-40°C to +85°C
D120A
E
D
Byte Endurance
10K
100K
E/W
+85°C to +125°C
D121
V
DRW
V
DD
 for Read/Write
V
MIN
5.5
V
Using EECON to read/write
V
MIN
 = Minimum operating voltage
D122
T
DEW
Erase/Write Cycle Time
4
ms
D123
T
RETD
Characteristic Retention
40
Year
Provided no other specifications 
are violated
D124
T
REF
Number of Total Erase/Write 
Cycles to Data EEPROM before 
Refresh*
1M
10M
Cycles -40°C to +85°C
D124A
T
REF
Number of Total Erase/Write 
Cycles before Refresh*
100K
1M
Cycles +85°C to +125°C
Program Flash Memory
D130
E
P
Cell Endurance
10K
100K
E/W
-40°C to +85°C
D130A
E
P
Cell Endurance
1000
10K
E/W
+85°C to +125°C
D131
V
PR
V
DD
 for Read
V
MIN
5.5
V
V
MIN
 = Minimum operating voltage
D132
V
IE
V
DD
 for Block Erase
4.5
5.5
V
Using ICSP™ port
D132A
V
IW
V
DD
 for Externally Timed Erase 
or Write
4.5
5.5
V
Using ICSP port
D132B
V
PEW
V
DD
 for Self-Timed Write
V
MIN
5.5
V
V
MIN
 = Minimum operating voltage
D133
T
IE
ICSP Erase Cycle Time
4
ms
V
DD
 
 4.5V
D133A
T
IW
ICSP Erase or Write Cycle Time 
(externally timed)
1
ms
V
DD
 
 4.5V
D133A
T
IW
Self-Timed Write Cycle Time
2
ms
D134
T
RETD
Characteristic Retention
40
Year
Provided no other specifications 
are violated
† Data in “Typ” column is at 5.0V, 25
°C unless otherwise stated. These parameters are for design guidance 
only and are not tested.
*