Texas Instruments Hercules TMS570LS04x/03x LaunchPad Evaluation Kit LAUNCHXL-TMS57004 LAUNCHXL-TMS57004 数据表
产品代码
LAUNCHXL-TMS57004
SPNS186A – OCTOBER 2012 – REVISED SEPTEMBER 2013
4.5.3
Clock Test Mode
The TMS570 platform architecture defines a special mode that allows various clock signals to be brought
out on to the ECLK pin and N2HET[2] device outputs. This mode is called the Clock Test mode. It is very
useful for debugging purposes and can be configured via the CLKTEST register in the system module.
out on to the ECLK pin and N2HET[2] device outputs. This mode is called the Clock Test mode. It is very
useful for debugging purposes and can be configured via the CLKTEST register in the system module.
Table 4-13. Clock Test Mode Options
CLKTEST[3-0]
SIGNAL ON ECLK
CLKTEST[11-8]
SIGNAL ON N2HET[2]
0000
Oscillator
0000
Oscillator Valid Status
Main PLL free-running clock output
0001
0001
Main PLL Valid status
(PLLCLK)
0010
Reserved
0010
Reserved
0011
Reserved
0011
Reserved
0100
CLK80K
0100
Reserved
0101
CLK10M
0101
CLK10M Valid status
0110
Reserved
0110
Reserved
0111
Reserved
0111
Reserved
1000
GCLK
1000
CLK80K
1001
RTI Base
1001
Oscillator Valid status
1010
Reserved
1010
Oscillator Valid status
1011
VCLKA1
1011
Oscillator Valid status
1100
Reserved
1100
Oscillator Valid status
1101
Reserved
1101
Oscillator Valid status
1110
Reserved
1110
Oscillator Valid status
1111
Flash HD Pump Oscillator
1111
Oscillator Valid status
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System Information and Electrical Specifications
37
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