Nxp Semiconductors PCA9665 User Manual
PCA9665_2
© NXP B.V. 2006. All rights reserved.
Product data sheet
Rev. 02 — 7 December 2006
71 of 91
NXP Semiconductors
PCA9665
Fm+ parallel bus to I
2
C-bus controller
13. Dynamic characteristics
[1]
Parameters are valid over specified temperature and voltage range.
[2]
All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0 V and 3.0 V with a transition time of
5 ns maximum. All time measurements are referenced at input voltages of 1.5 V and output voltages shown in
5 ns maximum. All time measurements are referenced at input voltages of 1.5 V and output voltages shown in
and
[3]
Test conditions for outputs: C
L
= 50 pF; R
L
= 500
Ω
, except open-drain outputs.
Test conditions for open-drain outputs: C
L
= 50 pF; R
L
= 1 k
Ω
pull-up to V
DD
.
[4]
Initialization time for the serial interface after ENSIO bit goes HIGH in a write operation to the control register.
[5]
Resetting the device while actively communicating on the bus may cause glitches or an errant STOP condition.
[6]
Upon reset, the full delay will be the sum of t
rst
and the RC time constant of the SDA and SCL bus.
Table 49.
Dynamic characteristics (3.3 volt)
V
CC
= 3.3 V
±
0.3 V; T
amb
=
−
40
°
C to +85
°
C; unless otherwise specified. (See
for 2.5 V)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Initialization timing
t
init(po)
power-on initialization time
-
-
550
µ
s
Serial interface initialization timing
t
init(sintf)
serial interface initialization time
from ENSIO bit HIGH
-
-
550
µ
s
RESET timing (see
t
w(rst)
reset pulse width
10
-
-
ns
t
rst
reset time
250
-
-
ns
t
rec(rst)
reset recovery time
0
-
-
ns
INT timing (see
)
t
as(int)
interrupt assert time
-
-
500
ns
t
das(int)
interrupt de-assert time
-
-
20
ns
Bus timing (see
t
su(A)
address setup time
to RD, WR LOW
0
-
-
ns
t
h(A)
address hold time
from RD, WR LOW
13
-
-
ns
t
su(CE_N)
CE setup time
to RD, WR LOW
0
-
-
ns
t
h(CE_N)
CE hold time
from RD, WR LOW
0
-
-
ns
t
w(RDL)
RD LOW pulse width
20
-
-
ns
t
w(WRL)
WR LOW pulse width
20
-
-
ns
t
d(DV)
data valid delay time
after RD and CE LOW
-
-
17
ns
t
d(QZ)
data output float delay time
after RD or CE HIGH
-
-
17
ns
t
su(Q)
data output setup time
before WR or CE HIGH (write cycle)
12
-
-
ns
t
h(Q)
data output hold time
after WR HIGH
0
-
-
ns
t
w(RDH)
RD HIGH pulse width
18
-
-
ns
t
w(WRH)
WR HIGH pulse width
18
-
-
ns