Avaya 03-300430 User Manual

Page of 2574
DS1-FAC (DS1 Facility)
Issue 1 June 2005
1069
 
System Technician-Demanded Tests:
Descriptions And Error Codes
Investigate tests in the order presented. By clearing error codes associated with the Failure 
Audit, you may clear errors generated from other tests in the sequence. Use test board to 
run Failure Audit.
.
Far-End Internal Loop-Back Test (#797)
This test is destructive.
This test starts at the DS1 converter circuit pack whose equipment location was entered and 
traverses over the specified facility and loops at the internal facility interface on the other DS1 
converter circuit pack in the DS1 converter complex. See the following diagram.
Every part of this test is executed under firmware control and the result is sent back to the 
maintenance software. The test is executed by sending digital data through every DS1 channel 
on this facility. For TN574 DS1 Converter facilities, test patterns are sent through every DS1 
channel. For TN1654 DS1 Converter facilities, test patterns are sent through one DS1 channel.
If there is only one DS1 facility available, the system will not allow that last facility to be busied 
out. In that case, the DS1 converter circuit pack must be busied out before executing this test.
For a standard-, duplex-, or high-reliability system (no PNC duplication), if there is only one DS1 
facility available, then this test can only be executed at the endpoint that is closer to the media 
server relative to the neighbor DS1 converter circuit pack because of its impacts on the system 
control links. For TN574 DS1 converter boards, the completion of the test will be delayed in this 
configuration to wait for the recovery of the system control links. For a critical-reliability system 
(PNC duplication) or for a system with multiple DS1 facilities, the test can be executed at any 
DS1 converter circuit pack.
If the test passes on a TN1654 DS1 facility, the round trip delay time appears in milliseconds in 
the Error Code field. The round trip delay time is the length of time in milliseconds it takes for 
the firmware to receive the test pattern after it has been sent.
Order of Investigation
Short Test 
Sequence
Long Test 
Sequence
External 
Loopback
Reset 
Sequence
D/ND
1
1.  D = Destructive; ND = Nondestructive
Failure Audit (#949)
ND
DS1 Interface Options Audit 
(#798)
X
X
ND
Far-End Internal Loopback 
(#797)
X
D
Near-End External 
Loopback test (#799)
X
D