Fujitsu FR81S User Manual
CHAPTER 50: RAM DIAGNOSIS FUNCTION
5. Operation
FUJITSU SEMICONDUCTOR LIMITED
CHAPTER : RAM DIAGNOSIS FUNCTION
FUJITSU SEMICONDUCTOR CONFIDENTIAL
43
5.4. RAM Diagnosis Fake Error Generation Procedure
This section explains the RAM diagnosis fake error generation procedure.
This function intentionally generates fake errors for software debugging.
Set the RAM diagnosis fake error generation for XBS RAM as following procedure:
1. Specify the error type with the TEST fake error generation control register (TFECRX).
(1) Set a diagnosis pattern to the TFECRX.ETYP[2:0] to generate a fake error.
(2) Specify a diagnosis pattern to generate a fake error by writing TFECRX.FERR="1".
2. Set the diagnosis start with the TEST diagnosis function register (TTCRX).
(1) Set a diagnosis pattern to operate with the TTCRX.TTYP[2:0].
(2) Write continuously "02
H
" -> "42
H
" -> "82
H
" -> "C2
H
" four times to the TEST key code
control register (TKCCRX), then start diagnosis pattern (See Section "5.1. RAM Diagnosis")
Perform the same procedure for RAM diagnosis for Backup RAM.
MB91520 Series
MN705-00010-1v0-E
2164