Intel G870 BX80623G870 User Manual

Product codes
BX80623G870
Page of 112
Signal Description
66
Datasheet, Volume 1
6.7
PLL Signals
6.8
TAP Signals
Table 6-9.
PLL Signals 
Signal Name
Description 
Direction/
Buffer Type
BCLK
BCLK#
Differential bus clock input to the processor
I
Diff Clk
Table 6-10. TAP Signals 
Signal Name
Description 
Direction/
Buffer Type
BPM#[7:0]
Breakpoint and Performance Monitor Signals: These signals are 
outputs from the processor that indicate the status of breakpoints 
and programmable counters used for monitoring processor 
performance.
I/O
CMOS
BCLK_ITP 
BCLK_ITP#
These pins are connected in parallel to the top side debug probe to 
enable debug capacities. 
I
DBR#
DBR# is used only in systems where no debug port is implemented 
on the system board. DBR# is used by a debug port interposer so 
that an in-target probe can drive system reset.
O
PRDY#
PRDY# is a processor output used by debug tools to determine 
processor debug readiness.
O
Asynchronous 
CMOS
PREQ#
PREQ# is used by debug tools to request debug operation of the 
processor.
I
Asynchronous 
CMOS
TCK
TCK (Test Clock): This signal provides the clock input for the 
processor Test Bus (also known as the Test Access Port). TCK must be 
driven low or allowed to float during power on Reset.
I
CMOS
TDI
TDI (Test Data In): This signal transfers serial test data into the 
processor. TDI provides the serial input needed for JTAG specification 
support.
I
CMOS
TDO
TDO (Test Data Out): This signal transfers serial test data out of the 
processor. TDO provides the serial output needed for JTAG 
specification support.
O
Open Drain
TMS
TMS (Test Mode Select): A JTAG specification support signal used by 
debug tools.
I
CMOS
TRST#
TRST# (Test Reset): This signal resets the Test Access Port (TAP) 
logic. TRST# must be driven low during power on Reset. 
I
CMOS