Microchip Technology MA330028 Data Sheet

Page of 530
dsPIC33EPXXXGP50X, dsPIC33EPXXXMC20X/50X AND PIC24EPXXXGP/MC20X
DS70000657H-page 414
 2011-2013 Microchip Technology Inc.
FIGURE 30-2:
EXTERNAL CLOCK TIMING    
Q1
Q2
Q3
Q4
OSC1
CLKO
Q1
Q2
Q3
OS20
OS30
OS30
OS40
OS41
OS31
OS31
Q4
OS25
TABLE 30-17: EXTERNAL CLOCK TIMING REQUIREMENTS 
AC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature
-40°C 
 T
A
 
 +85°C for Industrial
-40°C 
 T
A
 
 +125°C for Extended
Param
No.
Symb
Characteristic
Min.
Typ.
Max.
Units
Conditions
OS10
F
IN
External CLKI Frequency
(External clocks allowed only
in EC and ECPLL modes)
DC
60
MHz
EC
Oscillator Crystal Frequency
3.5
10

10
25
MHz
MHz
XT
HS
OS20
T
OSC
T
OSC
 = 1/F
OSC
8.33
DC
ns
+125ºC
T
OSC
 = 1/F
OSC
7.14
DC
ns
+85ºC
OS25
T
CY
Instruction Cycle Time
(
)
16.67
DC
ns
+125ºC
Instruction Cycle Time
(
)
14.28
DC
ns
+85ºC
OS30
TosL,
TosH
External Clock in (OSC1)
High or Low Time
0.45 x T
OSC
0.55 x T
OSC
ns
EC
OS31
TosR,
TosF
External Clock in (OSC1)
Rise or Fall Time
20
ns
EC
OS40
TckR
CLKO Rise Time
)
 
5.2
ns
OS41
TckF
CLKO Fall Time
5.2
ns
OS42
G
M
External Oscillator 
Transconductance
(
12
mA/V HS, V
DD
 = 3.3V,
T
A
 = +25ºC
6
mA/V XT,  V
DD
 = 3.3V,
T
A
 = +25ºC
Note 1:
Data in “Typical” column is at 3.3V, +25°C unless otherwise stated.
2:
Instruction cycle period (T
CY
) equals two times the input oscillator time base period. All specified values 
are based on characterization data for that particular oscillator type under standard operating conditions 
with the device executing code. Exceeding these specified limits may result in an unstable oscillator 
operation and/or higher than expected current consumption. All devices are tested to operate at 
“Minimum” values with an external clock applied to the OSC1 pin. When an external clock input is used, 
the “Maximum” cycle time limit is “DC” (no clock) for all devices.
3:
Measurements are taken in EC mode. The CLKO signal is measured on the OSC2 pin. 
4:
This parameter is characterized, but not tested in manufacturing.