SimpleTech ZeusIOPS User Manual
24
Zeus
IOPS
3.5-Inch Fibre Channel Solid State Drive Product Manual Rev. 1.0
P
ERFORMANCE
C
HARACTERISTICS
E
NDURANCE
The useful life of the flash media is limited by the number of write/erase operations that can be
performed on the media. Typically, the write/erase cycles for flash media ranges between 100,000
and 300,000. To extend the life of the SSD, special Wear-Leveling and Bad-Block Mapping
algorithms are integrated into the firmware, increasing the overall endurance rating of the drive to
2,000,000 Write/Erase cycles.
performed on the media. Typically, the write/erase cycles for flash media ranges between 100,000
and 300,000. To extend the life of the SSD, special Wear-Leveling and Bad-Block Mapping
algorithms are integrated into the firmware, increasing the overall endurance rating of the drive to
2,000,000 Write/Erase cycles.
W
EAR
-L
EVELING
A
LGORITHM
The dynamic wear-leveling algorithm guarantees that erase/write cycles are evenly distributed
across all the flash memory block locations. Wear-leveling eliminates repeated writes to the same
physical flash memory location, thereby preventing blocks from premature wear.
across all the flash memory block locations. Wear-leveling eliminates repeated writes to the same
physical flash memory location, thereby preventing blocks from premature wear.
B
AD
-B
LOCK
M
ANAGEMENT
The bad-block management scheme will detect faulty blocks during operation. Bad blocks are
flagged in a defect list. Blocks within the defect list are excluded and are never used for data storage.
flagged in a defect list. Blocks within the defect list are excluded and are never used for data storage.
D
ATA
R
ETENTION
Data stored on Zeus
IOPS
SSDs will remain valid for ten (10) years without requiring power support.
The unit can be stored at temperatures between -40
o
C and 70
o
C for extended periods without any
occurrence of data degradation.
E
RROR
D
ETECTION
AND
C
ORRECTION
The Error Detection Code and Error Correcting Code (EDC/ECC) algorithm helps maintain data
integrity by allowing single or multiple bit corrections to the data stored in the flash array. If the data
in the flash array is corrupted due to aging or during the programming process EDC/ECC will
compensate for the errors to ensure the delivery of accurate data to the host computer. The EDC/
ECC engine on the drive is capable of correcting 8 random or 12 sequential bytes in 1,024 bytes. The
possibility of undetected errors or incorrect correction is eliminated with additional CRC.
integrity by allowing single or multiple bit corrections to the data stored in the flash array. If the data
in the flash array is corrupted due to aging or during the programming process EDC/ECC will
compensate for the errors to ensure the delivery of accurate data to the host computer. The EDC/
ECC engine on the drive is capable of correcting 8 random or 12 sequential bytes in 1,024 bytes. The
possibility of undetected errors or incorrect correction is eliminated with additional CRC.
R
ELIABILITY
•
DC power is maintained as specified in the product manual.
•
Errors caused by host are excluded from rates.
•
Errors from the same causes are counted as 1 block.
•
Data stream is assumed random.