Hitachi Microscope & Magnifier S-3400N User Manual
2.3 Graphical User Interface (GUI)
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2.3.7.4 SCAN MODE Window
This window sets the Scan Mode.
This window sets the Scan Mode.
Fig. 2.3-28 SCAN MODE Block
(1) Norm
Image observation mode
(2) Line
Displays a line profile of the signal intensity as a horizontal line in the observed image.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
(3) Spot
Stops the scanning and places the electron beam at a specified point on the image.
Used for X-ray analysis of a point on the specimen.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
Used for X-ray analysis of a point on the specimen.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
(4) Area
Scans the electron beam in a selected frame in the image.
An advantage to this is that it allows an area-averaged spectrum as the beam is scanned
over a specified area, greater than the beam spot. Another advantage is that it reduces the
likelihood of specimen contamination in comparison with the stationary beam in Spot
Analysis mode.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
An advantage to this is that it allows an area-averaged spectrum as the beam is scanned
over a specified area, greater than the beam spot. Another advantage is that it reduces the
likelihood of specimen contamination in comparison with the stationary beam in Spot
Analysis mode.
This control toggles between the 1 (position setting) and 2 (line analysis) modes.
Scan mode button
Norm
Line
Spot
Area
Line
Spot
Area