Samsung MZMPC128HBFU-00000 Manuale Utente
- 30 -
datasheet
SSD
Rev. 1.0
MZMPC032HBCD-00000
MZMPC064HBDR-00000
MZMPC128HBFU-00000
MZMPC256HBGJ-00000
7.3.6 Self-test log structure
The following defines the 512 bytes that make up the Self-test log sector.
[Table 7-8] Self-test log data structure
Note: N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure
is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The
self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through
21.
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure
is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The
self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through
21.
7.3.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to
monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields
monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields
shown in these data structures follow the specifications for byte ordering.
Byte
Byte
0~1
Data structure revision
n*24+2
Self-test number
n*24+3
Self-test execution status
n*24+4~n*24+5
Life timestamp
n*24+6
Self-test failure check point
n*24+7~n*24+10
LBA of first failure
n*24+11~n*24+25
Vendor specific
...
...
506~507
Vendor specific
508
Self-test log pointer
509~510
Reserved
511
Data structure checksum
Byte
Description
Read/Write
0-1
Data structure revision
R/W
2-9
Starting LBA for test span 1
R/W
10-17
Ending LBA for test span 1
R/W
18-25
Starting LBA for test span 2
R/W
26-33
Ending LBA for test span 2
R/W
34-41
Starting LBA for test span 3
R/W
42-49
Ending LBA for test span 3
R/W
50-57
Starting LBA for test span 4
R/W
58-65
Ending LBA for test span 4+
R/W
66-73
Starting LBA for test span 5
R/W
74-81
Ending LBA for test span 5
R/W
82-337
Reserved
Reserved
338-491
Vendor specific
Vendor specific
492-499
Current LBA under test
Read
500-501
Current span under test
Read
502-503
Feature flags
R/W
504-507
Vendor Specific
Vendor specific
508-509
Selective self test pending time
R/W
510
Reserved
Reserved
511
Data structure checksum
R/W