Motorola MC9S12GC-Family ユーザーズマニュアル

107

The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.

The failure rates for data retention and program/erase cycling are specified at

<

2ppm defects over lifetime

at the operating conditions noted.

A program/erase cycle is specified as two transitions of the cell value from erased

→

 programmed

→

erased, 1

→

 0

→

 1.

All values shown in Table B-9 are target values and subject to further extensive
characterization.

Conditions are shown in Table A-4 unless otherwise noted

1

C

Data Retention at an average junction temperature of
T

Javg

 = 85

°

C

t

NVMRET

15

Years

2

C

Flash number of Program/Erase cycles

n

FLPE

10,000

Cycles