Rohde Schwarz Rohde & Schwarz HMO1002 2-channel oscilloscope, Digital Storage oscilloscope, 21-1002-RS00 데이터 시트
제품 코드
21-1002-RS00
32
Analysis
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An action is performed if the respective condition is met
(e.g. a specific number of mask failures). Each action is as-
signed a unique condition which can be defined separately
from the other actions. The respective condition can be
defined in the menu for the corresponding action. Select
the respective action by pressing the appropriate soft menu
key; the corresponding soft menu item will be highlighted in
blue. Press the MENU OFF key to return to the main menu
and to start the mask test.
(e.g. a specific number of mask failures). Each action is as-
signed a unique condition which can be defined separately
from the other actions. The respective condition can be
defined in the menu for the corresponding action. Select
the respective action by pressing the appropriate soft menu
key; the corresponding soft menu item will be highlighted in
blue. Press the MENU OFF key to return to the main menu
and to start the mask test.
On the right below the display window you can view the to-
tal number and the total duration of the tests (in brackets) in
white. The number of successful tests and their percentage
(in brackets) are displayed in green, and the number of fai-
lures and their percentage (in brackets) are displayed in red.
If a test has been started, the previously unavailable soft
menu key PAUSE is now activated. Pressing the PAUSE key
will interrupt the test while the acquisition of signals and
the total duration are continued. If you press the PAUSE key
again, the test will be resumed and all event counters conti-
nue to be incremented. If you deactivate a test by pressing
the soft menu key Stop the event and time counters will be
stopped. If a new test is started by pressing the soft menu
key TEST activated (Run), all counters will be reset and re-
sume at zero.
tal number and the total duration of the tests (in brackets) in
white. The number of successful tests and their percentage
(in brackets) are displayed in green, and the number of fai-
lures and their percentage (in brackets) are displayed in red.
If a test has been started, the previously unavailable soft
menu key PAUSE is now activated. Pressing the PAUSE key
will interrupt the test while the acquisition of signals and
the total duration are continued. If you press the PAUSE key
again, the test will be resumed and all event counters conti-
nue to be incremented. If you deactivate a test by pressing
the soft menu key Stop the event and time counters will be
stopped. If a new test is started by pressing the soft menu
key TEST activated (Run), all counters will be reset and re-
sume at zero.
The PASS/FAIL mode is deactivated by pressing the soft
menu key PASS/FAIL OFF.
menu key PASS/FAIL OFF.
9 .5 Component Test
The R&S®HMO1002 a built-in component tester. This can be
activated by pushing the UTIL button (VERTICAL section)
with the soft menu key COMP. TEST. The unit under test
is connected to the two contacts below the screen. After
switch on the component tester mode, the Y preamplifiers
and the time base are disconnected. While using the com-
ponent tester, signals may be present at the inputs as long
as the unit under test is not connected to any other circuit.
It is possible to test components remaining in their circuits,
but in such cases all signals must be disconnected from the
front panel BNC connectors (see the following paragraph:
activated by pushing the UTIL button (VERTICAL section)
with the soft menu key COMP. TEST. The unit under test
is connected to the two contacts below the screen. After
switch on the component tester mode, the Y preamplifiers
and the time base are disconnected. While using the com-
ponent tester, signals may be present at the inputs as long
as the unit under test is not connected to any other circuit.
It is possible to test components remaining in their circuits,
but in such cases all signals must be disconnected from the
front panel BNC connectors (see the following paragraph:
„Test in circuits“). The test principle is a generator within the
R&S®HMO1002 generates a 50 Hz or 200 Hz (±10 %) sine
wave which feeds the series connection of the test object
and a sense resistor. If the test object has only a real part
such as a resistor, both voltages will be in phase; the display
will be a straight line, more or less slanted. Is the test object
short-circuited, the line will be vertical (no voltage, current
maximum). If the test object is open-circuited or missing
a horizontal line will appear (voltage, but no current). The
angle of the line with the horizontal is a measure of the
resistance value, allowing for measurements of resistors
between Ω and kΩ. Capacitors and inductors cause phase
shift between voltage and current and hence between the
voltages. This will cause displays of ellipses. The location
and the form factor of the ellipse are determined by the
apparent impedance at 50 Hz (resp. 200 Hz). Capacitors
can be measured between µF and mF. An ellipse with its
longer axis horizontal indicates a high impedance (small
capacitance or large inductance). An ellipse with its longer
axis vertical indicates a low impedance (large capacitance
or small inductance). An ellipse with its longer axis slanted
indicates a relatively large resistive loss in series with the
impedance of the capacitor or inductor.
R&S®HMO1002 generates a 50 Hz or 200 Hz (±10 %) sine
wave which feeds the series connection of the test object
and a sense resistor. If the test object has only a real part
such as a resistor, both voltages will be in phase; the display
will be a straight line, more or less slanted. Is the test object
short-circuited, the line will be vertical (no voltage, current
maximum). If the test object is open-circuited or missing
a horizontal line will appear (voltage, but no current). The
angle of the line with the horizontal is a measure of the
resistance value, allowing for measurements of resistors
between Ω and kΩ. Capacitors and inductors cause phase
shift between voltage and current and hence between the
voltages. This will cause displays of ellipses. The location
and the form factor of the ellipse are determined by the
apparent impedance at 50 Hz (resp. 200 Hz). Capacitors
can be measured between µF and mF. An ellipse with its
longer axis horizontal indicates a high impedance (small
capacitance or large inductance). An ellipse with its longer
axis vertical indicates a low impedance (large capacitance
or small inductance). An ellipse with its longer axis slanted
indicates a relatively large resistive loss in series with the
impedance of the capacitor or inductor.
With semiconductors the transition from the non-conduc-
ting to the conducting state will be indicated in their cha-
racteristic. As far as is possible with the available voltages
and currents the forward and backward characteristics are
displayed (e.g. with zener diodes up to 9 V). Because this is
a two-pole measurement, the gain of a transistor can not
be determined, however, the B-C, B-E, C-E diodes can be
measured. With this exception the diodes can be measu-
red without fear of destruction as the maximum voltage
is limited to 9 V and the current to a few mA. This implies,
however, that a measurement of breakdown voltages > 9 V
is not possible. In general this is no dis-advantage because,
if there is a defect in a circuit, gross deviations are to be ex-
ting to the conducting state will be indicated in their cha-
racteristic. As far as is possible with the available voltages
and currents the forward and backward characteristics are
displayed (e.g. with zener diodes up to 9 V). Because this is
a two-pole measurement, the gain of a transistor can not
be determined, however, the B-C, B-E, C-E diodes can be
measured. With this exception the diodes can be measu-
red without fear of destruction as the maximum voltage
is limited to 9 V and the current to a few mA. This implies,
however, that a measurement of breakdown voltages > 9 V
is not possible. In general this is no dis-advantage because,
if there is a defect in a circuit, gross deviations are to be ex-
Fig. 9.5: Component test example.
Fig. 9.4: HZ20 adapter connected to AUX OUT