Texas Instruments CC2650DK 사용자 설명서

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3.2
Functional Description
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3.2.1
SysTick
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3.2.2
NVIC
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3.2.3
System Control Block (SCB)
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3.2.4
Instrumentation Trace Macrocell Unit (ITM)
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3.2.5
Flash Patch and Breakpoint Unit (FPB)
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3.2.6
Trace Port Interface Unit (TPIU)
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3.2.7
Data Watchpoint and Trace Unit (DWT)
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4
Interrupts and Events
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4.1
Exception Model
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4.1.1
Exception States
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4.1.2
Exception Types
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4.1.3
Exception Handlers
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4.1.4
Vector Table
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4.1.5
Exception Priorities
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4.1.6
Interrupt Priority Grouping
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4.1.7
Exception Entry and Return
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4.2
Fault Handling
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4.2.1
Fault Types
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4.2.2
Fault Escalation and Hard Faults
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4.2.3
Fault Status Registers and Fault Address Registers
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4.2.4
Lockup
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4.3
Event Fabric
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4.3.1
Introduction
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4.3.2
Event Fabric Overview
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4.4
AON Event Fabric
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4.4.1
Common Input Event List
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4.4.2
Event Subscribers
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4.5
MCU Event Fabric
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4.5.1
Common Input Event List
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4.5.2
Event Subscribers
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4.6
Interrupts and Events Registers
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4.6.1
AON_EVENT Registers
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4.6.2
EVENT Registers
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5
JTAG Interface
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5.1
Top Level Debug System
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5.2
cJTAG
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5.2.1
JTAG Commands
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5.2.2
Programming Sequences
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5.3
ICEPick™
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5.3.1
Secondary TAPs
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5.3.2
ICEPick™ Registers
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5.3.3
ROUTER Scan Chain
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5.3.4
TAP Routing Registers
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5.4
ICEMelter™
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5.5
Serial Wire Viewer (SWV)
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5.6
Halt In Boot (HIB)
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5.7
Debug and Shutdown
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5.8
Debug Features Supported Through WUC TAP
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5.9
Profiler Register
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6
Power, Reset, and Clock Management
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6.1
Introduction
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6.1.1
System CPU Mode
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3
SWCU117A – February 2015 – Revised March 2015
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