Lucent Technologies Release 7 Manual Do Utilizador
DEFINITY Enterprise Communications Server Release 7
Maintenance for R7r
Maintenance for R7r
555-230-126
Issue 4
June 1999
Maintenance Object Repair Procedures
9-732
DUPINT (Duplication Interface Circuit Pack)
9
the active and standby SPEs. After testing of DUPINT is complete, the command
release spe must be entered before memory shadowing is allowed to be turned
on and memory refresh to complete. Memory shadowing is not turned back on if
DUPINT, DUP-CHL or other MAJOR alarms pertinent to memory shadowing are
not retired. See STBY-SPE for more details as to how the turning on/off of
shadowing is controlled.
release spe must be entered before memory shadowing is allowed to be turned
on and memory refresh to complete. Memory shadowing is not turned back on if
DUPINT, DUP-CHL or other MAJOR alarms pertinent to memory shadowing are
not retired. See STBY-SPE for more details as to how the turning on/off of
shadowing is controlled.
The test duplication-interface and test duplication-interface long commands
run DUPINT and DUP-CHL tests. This is the only command that can run short
and long test sequences for these maintenance objects.
run DUPINT and DUP-CHL tests. This is the only command that can run short
and long test sequences for these maintenance objects.
Replacement procedures are provided for the standby Duplication Interface
circuit pack, the active Duplication Interface circuit pack, and the
interconnecting cable. These procedures are designed to prevent disruption of
customer service except when the active Duplication Interface circuit pack must
be replaced because of a failure that prevents memory shadowing. Each
procedure also describes testing after replacement to verify duplication
operation when SPE carrier A is active and when SPE carrier B is active. Test
failures in a procedure can direct you to another procedure for the replacement
and testing of a related component.
circuit pack, the active Duplication Interface circuit pack, and the
interconnecting cable. These procedures are designed to prevent disruption of
customer service except when the active Duplication Interface circuit pack must
be replaced because of a failure that prevents memory shadowing. Each
procedure also describes testing after replacement to verify duplication
operation when SPE carrier A is active and when SPE carrier B is active. Test
failures in a procedure can direct you to another procedure for the replacement
and testing of a related component.
Administration
No add or remove commands are associated with the Duplication Interface
circuit pack.
circuit pack.
In-line Errors
The Local FIFO Full Failure and DUPINT Driver Failure error types can raise
alarms when in-line errors are received. There are no tests that can retire these
reported alarms. The command line option of test duplication-interface long
clear with the long test sequence and the clear option is needed to clear alarms
for these in-line errors. The in-line error types are cleared by this command only if
no tests fail.
alarms when in-line errors are received. There are no tests that can retire these
reported alarms. The command line option of test duplication-interface long
clear with the long test sequence and the clear option is needed to clear alarms
for these in-line errors. The in-line error types are cleared by this command only if
no tests fail.
MAJOR vs. MINOR Alarms
DUPINT may have MAJOR or MINOR alarms. Whenever a MAJOR alarm is
raised, memory shadowing to the standby is turned off. A MINOR alarm does not
turn off shadowing. Neither type of alarm causes an SPE interchange.
raised, memory shadowing to the standby is turned off. A MINOR alarm does not
turn off shadowing. Neither type of alarm causes an SPE interchange.
Maintenance Object Interactions
The command test duplication-interface runs both DUPINT and DUP-CHL
non-destructive tests. The command test duplication-interface long runs both
DUPINT and DUP-CHL destructive and non-destructive tests. The second
command can only be run if the standby SPE is busied out. This busy out of the
standby SPE turns off memory shadowing, and lowers the health of the standby
to partially-functional; thereby preventing a possible interchange between the
non-destructive tests. The command test duplication-interface long runs both
DUPINT and DUP-CHL destructive and non-destructive tests. The second
command can only be run if the standby SPE is busied out. This busy out of the
standby SPE turns off memory shadowing, and lowers the health of the standby
to partially-functional; thereby preventing a possible interchange between the