Agilent Technologies 85225F Manual Do Utilizador
62
Installation and User’s Guide
1
Introducing the Agilent 85225F Performance Modeling System
RF Subsystem Performance Specifications
The overall performance of a network analyzer is dependent on the
individual instruments, system configuration, user- defined operating
conditions, measurement calibration, and cables.
individual instruments, system configuration, user- defined operating
conditions, measurement calibration, and cables.
In any high- frequency measurement, residual errors contribute
uncertainties to the results.
uncertainties to the results.
DC Subsystem Specifications
Specifications for the Agilent 4156C precision semiconductor parameter
analyzer are listed in its user’s guide, chapter 7 of Volume 1, “General
Information.”
analyzer are listed in its user’s guide, chapter 7 of Volume 1, “General
Information.”
Specifications for the Agilent E5260A 8- slot high speed measurement
mainframe and Agilent E5270B 8- slot precision parametric measurement
mainframe are listed in its user’s guide, Chapter 2, “Introduction.”
mainframe and Agilent E5270B 8- slot precision parametric measurement
mainframe are listed in its user’s guide, Chapter 2, “Introduction.”
Bias Network Characteristics
page 139 lists the operational characteristics of the bias networks. For
detailed information, refer to
detailed information, refer to
N O T E
When the system is configured with a probe station, microwave probes, on-wafer
calibration standards, or test fixtures, additional uncertainties are contributed to the
measurement results. Refer to the manufacturer’s documentation for information on probe
station or test fixture characteristics.
calibration standards, or test fixtures, additional uncertainties are contributed to the
measurement results. Refer to the manufacturer’s documentation for information on probe
station or test fixture characteristics.