Hitachi hard disk 0J11285 500 GB 2.5 " 8 MB 0J11285 Ficha De Dados
Códigos do produto
0J11285
Z5K500 OEM Specifications
155
14.41.7
Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host
to select the parameters for the self-test and to monitor the progress of the self-test. The following table
defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in
these data structures follow the specifications for byte ordering.
to select the parameters for the self-test and to monitor the progress of the self-test. The following table
defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in
these data structures follow the specifications for byte ordering.
Description Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12A
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W
Ending LBA for test span 5
8
4Ah
R/W
Reserved 256
52h
Reserved
Vendor specific
154
152h
Vendor specific
Current LBA under test
8
1ECh
Read
Current span under test
2
1F4h
Read
Feature flags
2
1F6
R/W
Vendor specific
4
1F8h
Vendor specific
Selective self test pending time
2
1FCh
R/W
Reserved 1
1FEh
Reserved
Data structure checksum
1
1FFh
R/W
512
Table 124 Selective self-test log data structure
14.41.8
Error Reporting
The following table shows the values returned in the Status and Error Registers when specific error
conditions are encountered by a device.
conditions are encountered by a device.
Error Condition
Status Register
Error Register
A S.M.A.R.T. FUNCTION SET command was received by
the device without the required key being loaded into the
LBA High and LBA Mid registers.
the device without the required key being loaded into the
LBA High and LBA Mid registers.
51h 04h
A S.M.A.R.T. FUNCTION SET command was received by
the device with a subcommand value in the Features
Register that is either invalid or not supported by this device.
the device with a subcommand value in the Features
Register that is either invalid or not supported by this device.
51h 04h
A S.M.A.R.T. FUNCTION SET command subcommand
other than S.M.A.R.T. ENABLE OPERATIONS was received
by the device while the device was in a “S.M.A.R.T.
disabled” state.
other than S.M.A.R.T. ENABLE OPERATIONS was received
by the device while the device was in a “S.M.A.R.T.
disabled” state.
51h 04h
The device is unable to read its Attribute Values or Attribute
Thresholds data structure.
Thresholds data structure.
51h
10h or 40h
The device is unable to write to its Attribute Values data
structure.
structure.
51h
10h or 01h
Table 125 S.M.A.R.T. Error Codes