Fujitsu FR81S User Manual
CHAPTER 50: RAM DIAGNOSIS FUNCTION
4. Registers
FUJITSU SEMICONDUCTOR LIMITED
CHAPTER : RAM DIAGNOSIS FUNCTION
FUJITSU SEMICONDUCTOR CONFIDENTIAL
15
4.6. TEST Diagnosis Function Register XBS RAM : TTCRX
This section explains the bit structure of TEST Diagnosis Function Register XBS RAM.
The TEST diagnosis function register (TTCRX) specifies the RAM diagnosis content for XBS RAM, and
holds the diagnosis result and its status.
•
TTCRX: Address 301E
H
(Access: Byte, Half-word, Word)
15
14
13
12
11
10
9
8
BIT
Reserved
TSTAT
OVFLW
0
0
0
0
0
0
0
0
Initial values
R0, W0
R0, W0
R0, W0
R0, W0
R0, W0
R0, W0
R, WX
R, WX
Attributes
7
6
5
4
3
2
1
0
BIT
TEIE
TEI
TCIE
TCI
TTYP2
TTYP1
TTYP0
TRUN
0
0
0
0
1
1
0
0
Initial values
R/W
R(RM1),W
R/W
R (RM1), W
R/W
R/W
R/W
R, WX
Attributes
[bit15 to bit10] Reserved
Reserved bits. These bits read out "0". At writing, write "0".
[bit9] TSTAT: RAM diagnosis error detection bit
TSTAT
Function
0
No error is detected with the RAM diagnosis
1
An error is detected with the RAM diagnosis
If an error occurs during RAM diagnosis for XBS RAM, this bit is set to "1".
This bit is initialized (cleared to "0") by hardware, using the RAM diagnosis start instruction as the trigger.
[bit8] OVFLW: RAM diagnosis error overflow bit
OVFLW
Function
0
During the RAM diagnosis, an error occurs in three or less addresses
1
During the RAM diagnosis, an error occurs in four or more addresses
If a RAM diagnosis error for XBS RAM occurs in four or more addresses, this bit is set to "1".
This bit is initialized (cleared to "0") by hardware, using the RAM diagnosis start instruction as the trigger.
MB91520 Series
MN705-00010-1v0-E
2136