Puls CS10.241 Power Supply Guia De Especificação
CS10.241, CS10.241-S1
C–Series
24V, 10A, S
INGLE
P
HASE
I
NPUT
August 2006 / Rev. 1.1 DS-CS10.241-EN / All parameters are specified at 24V, 10A, 230Vac and 25°C ambient unless otherwise noted.
www.pulspower.com Phone +49 89 9278 0 Germany
7/20
10. F
UNCTIONAL
D
IAGRAM
Fig. 10-1 Functional diagram
+
+
-
-
V
OUT
Input Fuse
&
Input Filter
&
Input Filter
Output
Voltage
Regulator
Power
Converter
Output
Filter
DC
ok
L
N
Output
Over-
Voltage
Protection
Input
Rectifier
&
Inrush
Limiter
Rectifier
&
Inrush
Limiter
115/230V
Auto Select
11. R
ELIABILITY
AC 100V
AC 120V
AC 230V
Lifetime expectancy
min.
38 000h
50 000h
75 000h
40°C, 24V, 10A
min.
27 000h
34 000h
53 000h
40°C, 24V, 12A
min.
93 000h
99 000h
118 000h
40°C, 24V, 5A
min.
108 000h
15 years
15 years
25°C, 24V, 10A
MTBF SN 29500, IEC 61709
612 000h
638 000h
821 000h
40°C, 24V, 10A
520 000h
542 000h
698 000h
40°C, 24V, 12A
1 019 000h
1 058 000h
1 393 000h
25°C, 24V, 10A
MTBF MIL HDBK 217F
456 000h 447
000h 472
000h
40°C, 24V, 10A, Ground Benign GB40
410 000h
402 000h
425 000h
40°C, 24V, 12A, Ground Benign GB40
632 000h
628 000h
653 000h
25°C, 24V, 10A, Ground Benign GB25
The Lifetime expectancy shown in the table indicates the operating hours (service life) and is determined by the
lifetime expectancy of the built-in electrolytic capacitors.
lifetime expectancy of the built-in electrolytic capacitors.
Lifetime expectancy is specified in operational hours. Lifetime expectancy is calculated according to the capacitor’s
manufacturer specification. The prediction model allows a calculation of up to 15 years from date of shipment.
manufacturer specification. The prediction model allows a calculation of up to 15 years from date of shipment.
MTBF stands for Mean Time Between Failure, which is calculated according to statistical device failures, and indicates
reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily
represent the life of a product.
reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily
represent the life of a product.