Intel 2760QM FF8062701065300 User Manual
Product codes
FF8062701065300
Datasheet, Volume 1
63
Electrical Specifications
7.5.2
Die Voltage Validation
Core voltage (V
CC
) overshoot events at the processor must meet the specifications in
Table 7-11
when measured across the VCC_SENSE and VSS_VCC_SENSE lands.
Overshoot events that are < 10 ns in duration may be ignored. These measurements of
processor die level overshoot should be taken with a 100 MHz bandwidth limited
oscilloscope.
processor die level overshoot should be taken with a 100 MHz bandwidth limited
oscilloscope.
7.5.2.1
V
CC
Overshoot Specifications
The processor can tolerate short transient overshoot events where V
CC
exceeds the VID
voltage when transitioning from a high-to-low current load condition. This overshoot
cannot exceed VID + V
cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot above
VID). These specifications apply to the processor die voltage as measured across the
VCC_SENSE and VSS_VCC_SENSE lands.
VCC_SENSE and VSS_VCC_SENSE lands.
Notes:
1.
1.
V
OS
is the measured overshoot voltage.
2.
T
OS_MAX
is the measured time duration above VccMAX(I1).
3.
Istep: Load Release Current Step, for example, I2 to I1, where I2 > I1.
4.
VccMAX(I1) = VID - I1*RLL + 15 mV
Table 7-11. V
CC
Overshoot Specifications
Symbol
Parameter
Min
Max
Units
Figure
Notes
V
OS_MAX
Magnitude of V
CC
overshoot above VID
—
65
mV
7-3
T
OS_MAX
Time duration of V
CC
overshoot above
VccMAX value at the new lighter load
—
25
ms
7-3
Figure 7-3.
V
CC
Overshoot Example Waveform
0
5
10
15
20
25
V
ol
ta
ge
[V
]
Time [us]
VccMAX (I1)
VID + V
OS_MAX
T
OS_MAX
V
OS_MAX